What type of hardware are you using: Raspberry Pi 3, 4+
What YunoHost version are you running: 12.1.17.1
How are you able to access your server: The webadmin
SSH
Are you in a special context or did you perform specific tweaking on your YunoHost instance ?: Non
Describe your issue
Bonjour,
Depuis la mise à jour vers la version 12.1, je reçois des messages d’erreur de mon serveur avec comme objet:
SMART error (CurrentPendingSector) detected on host:
Le message est celui-ci:
This message was generated by the smartd daemon running on:
host name: pgcc
DNS domain: ynh.frThe following warning/error was logged by the smartd daemon:
Device: /dev/sda [SAT], 8 Currently unreadable (pending) sectors
Device info:
SPCC Solid State Disk, S/N:AA230130S3051201289, WWN:0-000000-000000000, FW:HPS1104J, 512 GB
For details see host’s SYSLOG.
You can also use the smartctl utility for further investigation.
The original message about this issue was sent at Sat Aug 30 17:12:40 2025 BST
Another message will be sent in 24 hours if the problem persists.
De ce que je comprend il y a des secteurs de mon disque qui sont endommagés.
Est-ce que c’est bien ça ?
Au quel cas, quelles sont les mesures à prendre ?
J’ai cherché dans les logs mais je n’ai pas trouvé ou cherché au bon endroit.
Merci à tous pour vos réponses
Share relevant logs or error messages
sudo smartctl -a /dev/sda
smartctl 7.3 2022-02-28 r5338 [aarch64-linux-6.1.21-v8+] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SPCC Solid State Disk
Serial Number: AA230130S3051201289
LU WWN Device Id: 0 000000 000000000
Firmware Version: HPS1104J
User Capacity: 512,110,190,592 bytes [512 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: Not in smartctl database 7.3/5319
ATA Version is: ACS-2 T13/2015-D revision 3
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Sep 6 13:11:09 2025 BST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5d) SMART execute Offline immediate.
No Auto Offline data collection support.
Abort Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 4) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x0032 100 100 050 Old_age Always - 0
5 Reallocated_Sector_Ct 0x0032 100 100 050 Old_age Always - 0
9 Power_On_Hours 0x0032 100 100 050 Old_age Always - 19388
12 Power_Cycle_Count 0x0032 100 100 050 Old_age Always - 116
160 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 0
161 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 0
163 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 236
164 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 35
165 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 338
166 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 1
167 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 41
168 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 0
169 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 100
175 Program_Fail_Count_Chip 0x0032 100 100 050 Old_age Always - 1006632960
176 Erase_Fail_Count_Chip 0x0032 100 100 050 Old_age Always - 2423434
177 Wear_Leveling_Count 0x0032 100 100 050 Old_age Always - 660206
178 Used_Rsvd_Blk_Cnt_Chip 0x0032 100 100 050 Old_age Always - 318767104
181 Program_Fail_Cnt_Total 0x0032 100 100 050 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 050 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 100 100 050 Old_age Always - 115
194 Temperature_Celsius 0x0032 100 100 050 Old_age Always - 40
195 Hardware_ECC_Recovered 0x0032 100 100 050 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 100 100 050 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 050 Old_age Always - 8
198 Offline_Uncorrectable 0x0032 100 100 050 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x0032 100 100 050 Old_age Always - 0
232 Available_Reservd_Space 0x0032 100 100 050 Old_age Always - 0
241 Total_LBAs_Written 0x0032 100 100 050 Old_age Always - 55237
242 Total_LBAs_Read 0x0032 100 100 050 Old_age Always - 977733
249 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 203285
SMART Error Log Version: 1
ATA Error Count: 6 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 6 occurred at disk power-on lifetime: 18098 hours (754 days + 2 hours)
When the command that caused the error occurred, the device was in an unknown state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 40 00 c0 88 e0 51 at LBA = 0x01e088c0 = 31492288
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 00 c0 88 e0 40 00 11d+13:58:35.500 WRITE FPDMA QUEUED
e7 08 00 00 20 28 00 00 11d+13:58:34.440 FLUSH CACHE
61 08 00 00 20 28 40 00 11d+13:58:34.440 WRITE FPDMA QUEUED
e7 08 00 60 96 29 00 00 11d+13:58:34.440 FLUSH CACHE
61 08 00 60 96 29 40 00 11d+13:58:34.440 WRITE FPDMA QUEUED
Error 5 occurred at disk power-on lifetime: 10514 hours (438 days + 2 hours)
When the command that caused the error occurred, the device was in an unknown state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 40 00 b0 c0 3c 51 at LBA = 0x013cc0b0 = 20758704
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 00 b0 c0 3c 40 00 5d+01:05:22.604 WRITE FPDMA QUEUED
e7 08 00 b0 c0 3c 00 00 5d+01:05:22.554 FLUSH CACHE
61 08 00 b0 c0 3c 40 00 5d+01:05:22.544 WRITE FPDMA QUEUED
e7 08 00 b0 c0 3c 00 00 5d+01:05:22.544 FLUSH CACHE
61 08 00 b0 c0 3c 40 00 5d+01:05:22.544 WRITE FPDMA QUEUED
Error 4 occurred at disk power-on lifetime: 8675 hours (361 days + 11 hours)
When the command that caused the error occurred, the device was in an unknown state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 40 00 00 a5 3c 51 at LBA = 0x013ca500 = 20751616
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 00 00 a5 3c 40 00 11d+08:53:37.510 WRITE FPDMA QUEUED
e7 08 00 00 a5 3c 00 00 11d+08:53:37.500 FLUSH CACHE
61 08 00 00 a5 3c 40 00 11d+08:53:37.500 WRITE FPDMA QUEUED
e7 08 00 00 a5 3c 00 00 11d+08:53:37.480 FLUSH CACHE
61 08 00 00 a5 3c 40 00 11d+08:53:37.480 WRITE FPDMA QUEUED
Error 3 occurred at disk power-on lifetime: 8402 hours (350 days + 2 hours)
When the command that caused the error occurred, the device was in an unknown state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 40 00 90 f6 3c 51 at LBA = 0x013cf690 = 20772496
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 00 90 f6 3c 40 00 21d+06:39:34.670 WRITE FPDMA QUEUED
e7 08 00 90 f6 3c 00 00 21d+06:39:34.660 FLUSH CACHE
61 08 00 90 f6 3c 40 00 21d+06:39:34.660 WRITE FPDMA QUEUED
e7 08 00 90 f6 3c 00 00 21d+06:39:34.650 FLUSH CACHE
61 08 00 90 f6 3c 40 00 21d+06:39:34.650 WRITE FPDMA QUEUED
Error 2 occurred at disk power-on lifetime: 6606 hours (275 days + 6 hours)
When the command that caused the error occurred, the device was in an unknown state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 40 00 c8 dd 3b 51 at LBA = 0x013bddc8 = 20700616
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 00 c8 dd 3b 40 00 05:07:06.030 WRITE FPDMA QUEUED
e7 08 00 28 9f 29 00 00 05:07:05.410 FLUSH CACHE
61 08 00 28 9f 29 40 00 05:07:05.410 WRITE FPDMA QUEUED
e7 40 00 e8 9e 29 00 00 05:07:05.400 FLUSH CACHE
61 40 00 e8 9e 29 40 00 05:07:05.330 WRITE FPDMA QUEUED
SMART Self-test log structure revision number 0
Warning: ATA Specification requires self-test log structure revision number = 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.